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PRELIMINARY
CY7C1323BV25
18-Mbit 4-Word Burst SRAM with DDR-I Architecture
Features
* 18-Mbit Density (512 Kbit x 36) * 167-MHz Clock for high bandwidth * 4-Word Burst for reducing address bus frequency * Double Data Rate (DDR) interfaces (data transferred at 333 MHz @ 167 MHz) * Two input clocks (K and K) for precise DDR timing - SRAM uses rising edges only * Two output clocks (C and C) account for clock skew and flight time mismatching * Separate Port Selects for depth expansion * Synchronous internally self-timed writes * 2.5V core power supply with HSTL Inputs and Outputs * Variable drive HSTL output buffers * Expanded HSTL output voltage (1.4V-1.9V) * 13 x 15 x 1.4mm 1.0-mm pitch fBGA package, 165 ball (11 x 15 matrix) * JTAG 1149.1 compatible test access port
Functional Description
The CY7C1323BV25 is a 2.5V Synchronous Pipelined SRAM equipped with DDR-I (Double Data Rate) architecture. The DDR-I architecture consists of an SRAM core with advanced synchronous peripheral circuitry and a 2-bit burst counter. Addresses for Read and Write are latched on alternate rising edges of the input (K) clock.Write data is registered on the rising edges of both K and K. Read data is driven on the rising edges of C and C if provided, or on the rising edge of K and K if C/C are not provided. Every read or write operation is associated with four words that burst sequentially into or out of the device. The burst counter takes in the least two significant bits of the external address and bursts four 36-bit words. Depth expansion is accomplished with Port Selects for each port. Port selects allow each port to operate independently. Asynchronous inputs include impedance match (ZQ). Synchronous data outputs (Q, sharing the same physical pins as the data inputs D) are tightly matched to the two output echo clocks CQ/CQ, eliminating the need for separately capturing data from each individual DDR SRAM in the system design. Output data clocks(C/C) are also provided for maximum system clocking and data synchronization flexibility. All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the C or C input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry.
Configuration
CY7C1323AV25 - 256K x 36
Logic Block Diagram (CY7C1323AV25)
A(1:0) 19 A(18:0)
17
Burst Logic
Address A(18:2) Register
Write Add. Decode
Write Write Write Write Reg Reg Reg Reg
LD K K CLK Gen.
Read Add. Decode
512K x 36 Array
36 Output Logic Control
Read Data Reg. 144 Control Logic 72 Reg. 72 Reg. 36 Reg.
C C
CQ CQ 36 DQ[35:0]
Vref R/W BWS[3:0]
Cypress Semiconductor Corporation Document #: 38-05631 Rev. **
*
3901 North First Street
*
San Jose, CA 95134
* 408-943-2600 Revised July 29, 2004
PRELIMINARY
Selection Guide
167 MHz Maximum Operating Frequency Maximum Operating Current 167 TBD 133 MHz 133 TBD
CY7C1323BV25
100 MHz 100 TBD
Unit MHz mA
Pin Configuration
CY7C1323BV25 (256K x 36) - 11 x 15 FBGA
1 A B C D E F G H J K L M N P R
CQ NC NC NC NC NC NC NC NC NC NC NC NC NC TDO
2
DQ27 NC DQ29 NC DQ30 DQ31 VREF NC NC DQ33 NC DQ35 NC TCK
3
DQ18 DQ28 DQ19 DQ20 DQ21 DQ22 VDDQ DQ32 DQ23 DQ24 DQ34 DQ25 DQ26 A
4
R/W A VSS VSS VDDQ VDDQ VDDQ VDDQ VDDQ VDDQ VDDQ VSS VSS A A
5
BWS2 BWS3 A VSS VSS VDD VDD VDD VDD VDD VSS VSS A A A
6
K K A0 VSS VSS VSS VSS VSS VSS VSS VSS VSS A C C
7
BWS1 BWS0 A1 VSS VSS VDD VDD VDD VDD VDD VSS VSS A A A
8
LD A VSS VSS VDDQ VDDQ VDDQ VDDQ VDDQ VDDQ VDDQ VSS VSS A A
9
A NC NC NC NC NC NC VDDQ NC NC NC NC NC NC A
10
GND/72M NC DQ17 NC DQ15 NC NC VREF DQ13 DQ12 NC DQ11 NC DQ9 TMS
11
CQ DQ8 DQ7 DQ16 DQ6 DQ5 DQ14 ZQ DQ4 DQ3 DQ2 DQ1 DQ10 DQ0 TDI
GND/144M NC/36M
Pin Definitions
Name DQ[35:0] I/O Input/OutputSynchronous Description Data Input/Output signals. Inputs are sampled on the rising edge of K and K clocks during valid write operations. These pins drive out the requested data during a Read operation. Valid data is driven out on the rising edge of both the C and C clocks during Read operations or K and K when in single clock mode. When Read access is deselected, Q[35:0] are automatically three-stated. Synchronous Load. This input is brought LOW when a bus cycle sequence is to be defined. This definition includes address and read/write direction. All transactions operate on a burst of 4 data (two clock periods of bus activity). Byte Write Select 0, 1, 2 and 3 - active LOW. Sampled on the rising edge of the K and K clocks during Write operations. Used to select which byte is written into the device during the current portion of the Write operations. Bytes not written remain unaltered. CY7C1323BV25 - BWS0 controls D[8:0], BWS1 controls D[17:9], BWS2 controls D[26:18] and BWS3 controls D[35:27] All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select will cause the corresponding byte of data to be ignored and not written into the device. Address inputs. These address inputs are multiplexed for both Read and Write operations. A0 and A1 are the inputs to the burst counter. These are incremented in a linear fashion internally. 19 address inputs are needed to access the entire memory array. All the address inputs are ignored when the part is deselected. Synchronous Read/Write Input. When LD is LOW, this input designates the access type (Read when R/W is HIGH, Write when R/W is LOW) for loaded address. R/W must meet the set-up and hold times around edge of K.
LD
InputSynchronous InputSynchronous
BWS0, BWS1, BWS2, BWS3
A, A0, A1
InputSynchronous
R/W
InputSynchronous
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PRELIMINARY
Pin Definitions (continued)
Name C I/O Input-Clock Description
CY7C1323BV25
Positive Output Clock Input. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details. Negative Output Clock Input. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details. Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device and to drive out data through Q[35:0] when in single clock mode. All accesses are initiated on the rising edge of K. Negative Input Clock Input. K is used to capture synchronous inputs being presented to the device and to drive out data through Q[35:0] when in single clock mode. CQ is referenced with respect to C. This is a free running clock and is synchronized to the output clock (C) of the DDR-I. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC timing table. CQ is referenced with respect to C. This is a free running clock and is synchronized to the output clock (C) of the DDR-I. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC timing table. Output Impedance Matching Input. This input is used to tune the device outputs to the system data bus impedance. CQ, CQ and Q[35:0] output impedance are set to 0.2 x RQ, where RQ is a resistor connected between ZQ and ground. Alternately, this pin can be connected directly to VDD, which enables the minimum impedance mode. This pin cannot be connected directly to GND or left unconnected. TDO for JTAG. TCK pin for JTAG. TDI pin for JTAG. TMS pin for JTAG. Not connected to the die. Can be tied to any voltage level. Address expansion for 36M. This is not connected to the die. Address expansion for 72M. This should be tied LOW. Address expansion for 144M. This should be tied LOW. Reference Voltage Input. Static input used to set the reference level for HSTL inputs and Outputs as well as AC measurement points. Power supply inputs to the core of the device. Ground for the device. Power supply inputs for the outputs of the device. All synchronous control (R/W, LD, BWS0, BWS1, BWS2, BWS3) inputs pass through input registers controlled by the rising edge of the input clocks (K and K). Read Operations The CY7C1323BV25 is organized internally as an array of 512K x 36. Accesses are completed in a burst of four sequential 36-bit data words. Read operations are initiated by asserting R/W HIGH and LD LOW at the rising edge of the Positive Input Clock (K). The address presented to Address inputs are stored in the Read address register and the least two significant bits of the address are presented to the burst counter. The burst counter increments the address in a linear fashion. Following the next K clock rise the corresponding 36-bit word of data from this address location is driven onto the Q[35:0] using C as the output timing reference. On the subsequent rising edge of C the next 36-bit data word from the address location generated by the burst counter is driven onto Page 3 of 18
C
Input-Clock
K
Input-Clock
K CQ
Input-Clock Echo Clock
CQ
Echo Clock
ZQ
Input
TDO TCK TDI TMS NC NC/36M GND/72M GND/144M VREF VDD VSS VDDQ
Output Input Input Input N/A N/A Input Input InputReference Power Supply Ground Power Supply
Introduction
Functional Overview The CY7C1323BV25 is a synchronous pipelined Burst SRAM equipped with DDR interface. Accesses are initiated on the Positive Input Clock (K). All synchronous input timing is referenced from the rising edge of the input clocks (K and K) and all output timing is referenced to the rising edge of output clocks (C and C or K and K when in single clock mode). All synchronous data inputs (D[35:0]) pass through input registers controlled by the input clocks (K and K). All synchronous data outputs (Q[35:0]) pass through output registers controlled by the rising edge of the output clocks (C and C or K and K when in single clock mode).
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PRELIMINARY
the Q[35:0]. This process continues until all four 36-bit data words have been driven out onto Q[35:0]. The requested data will be valid 3 ns from the rising edge of the output clock (C or C, 167 MHz device). In order to maintain the internal logic, each read access must be allowed to complete. Each Read access consists of four 36-bit data words and takes 2 clock cycles to complete. Therefore, Read accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Read request. Read accesses can be initiated on every other K clock rise. Doing so will pipeline the data flow such that data is transferred out of the device on every rising edge of the output clocks (C and C or K and K when in single clock mode). When the read port is deselected, the CY7C1323BV25 will first complete the pending read transactions. Synchronous internal circuitry will automatically three-state the outputs following the next rising edge of the Positive Output Clock (C). This will allow for a seamless transition between devices without the insertion of wait states in a depth expanded memory. Write Operations Write operations are initiated by asserting R/W LOW and LD LOW at the rising edge of the Positive Input Clock (K). The address presented to Address inputs are stored in the Write address register and the least two significant bits of the address are presented to the burst counter. The burst counter increments the address in a linear fashion. On the following K clock rise the data presented to D[35:0] is latched and stored into the 36-bit Write Data register provided BWS[3:0] are asserted active. On the subsequent rising edge of the negative input clock (K) the information presented to D[35:0] is also stored into the Write Data Register provided BWS[3:0] are asserted active. This process continues for one more cycle until four 36-bit words (a total of 144 bits) of data are stored in the SRAM. The 144 bits of data are then written into the memory array at the specified location. Therefore, Write accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Write request. Write accesses can be initiated on every other rising edge of the positive input clock (K). Doing so will pipeline the data flow such that 36-bits of data can be transferred into the device on every rising edge of the input clocks (K and K). When deselected, the Write port will ignore all inputs after the pending Write operations have been completed. Byte Write Operations Byte Write operations are supported by the CY7C1323BV25. A Write operation is initiated as described in the Write Operation section above. The bytes that are written are determined by BWS[3:0] which are sampled with each set of 36-bit data word. Asserting the appropriate Byte Write Select input during the data portion of a write will allow the data being presented to be latched and written into the device. Deasserting the Byte Write Select input during the data portion of a write will allow the data stored in the device for that byte
CY7C1323BV25
to remain unaltered. This feature can be used to simplify Read/Modify/Write operations to a Byte Write operation. Single Clock Mode The CY7C1323BV25 can be used with a single clock that controls both the input and output registers. In this mode the device will recognize only a single pair of input clocks (K and K) that control both the input and output registers. This operation is identical to the operation if the device had zero skew between the K/K and C/C clocks. All timing parameters remain the same in this mode. To use this mode of operation, the user must tie C and C HIGH at power on. This function is a strap option and not alterable during device operation. DDR Operation The CY7C1323BV25 enables high performance operation through high clock frequencies (achieved through pipelining) and double data rate mode of operation. At slower frequencies, the CY7C1323BV25 requires a single No Operation (NOP) cycle when transitioning from a Read to a Write cycle. At higher frequencies, a second NOP cycle may be required to prevent bus contention. If a Read occurs after a Write cycle, address and data for the Write are stored in registers. The write information must be stored because the SRAM can not perform the last word Write to the array without conflicting with the Read. The data stays in this register until the next Write cycle occurs. On the first Write cycle after the Read(s), the stored data from the earlier Write will be written into the SRAM array. This is called a Posted Write. Depth Expansion Depth expansion requires replicating the LD control signal for each bank. All other control signals can be common between banks as appropriate. Echo Clocks Echo clocks are provided on the DDR-I to simplify data capture on high-speed systems. Two echo clocks are generated by the DDR-I. CQ is referenced with respect to C and CQ is referenced with respect to C. These are free-running clocks and are synchronized to the output clock of the DDR-I. In the single clock mode, CQ is generated with respect to K and CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table. Programmable Impedance An external resistor, RQ must be connected between the ZQ pin on the SRAM and VSS to allow the SRAM to adjust its output driver impedance. The value of RQ must be 5X the value of the intended line impedance driven by the SRAM, The allowable range of RQ to guarantee impedance matching with a tolerance of 15% is between 175 and 350, with VDDQ=1.5V. The output impedance is adjusted every 1024 cycles to adjust for drifts in supply voltage and temperature.
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PRELIMINARY
Application Example[1]
ZQ CQ/CQ# LD# R/W# C C# K K#
CY7C1323BV25
DQ A
SRAM#1
R = 250ohms
DQ A
ZQ CQ/CQ# LD# R/W# C C# K K#
SRAM#2
R = 250ohms
DQ Addresses Cycle Start# R/W# Return CLK Source CLK Return CLK# Source CLK# Echo Clock1/Echo Clock#1 Echo Clock2/Echo Clock#2
BUS MASTER (CPU or ASIC)
Vterm = 0.75V R = 50ohms Vterm = 0.75V
Truth Table[2, 3, 4, 5, 6, 7]
Operation Write Cycle: Load address; wait one cycle; input write data on 2 consecutive K and K rising edges. Read Cycle: Load address; wait one cycle; read data on 2 consecutive C and C rising edges. NOP: No Operation Standby: Clock Stopped L-H K L LD R/W L
[8]
DQ D(A1)at K(t+1)
DQ D(A2) at K(t+1)
DQ
DQ
D(A3) at K(t+2) D(A4) at K(t+2)
L-H
L
H[9]
Q(A1) at C(t+1)
Q(A2) at C(t+1)
Q(A3) at C(t+2)
Q(A4) at C(t+2)
L-H Stopped
H X
X X
High-Z
High-Z
High-Z)
High-Z
Previous State Previous State Previous State Previous State
Linear Burst Address Table
First Address (External) X..X00 X..X01 X..X10 X..X11 Second Address (Internal) X..X01 X..X10 X..X11 X..X00 Third Address (Internal) X..X10 X..X11 X..X00 X..X01 Fourth Address (Internal) X..X11 X..X00 X..X01 X..X10
Notes: 1. The above application shows 2 DDR-I being used. 2. X = "Don't Care", H = Logic HIGH, L = Logic LOW, represents rising edge. 3. Device will power-up deselected and the outputs in a three-state condition. 4. "A1" represents address location latched by the devices when transaction was initiated. A2, A3 and A4 represents the internal address sequence in the burst. 5. "t" represents the cycle at which a Read/Write operation is started. t+1 and t+2 are the first and second clock cycles succeeding the "t" clock cycle. 6. Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode. 7. It is recommended that K = K and C = C when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging symmetrically. 8. This signal was HIGH on previous K clock rise. Initiating consecutive Write operations on consecutive K clock rises is not permitted. The device will ignore the second Write request. 9. This signal was LOW on previous K clock rise. Initiating consecutive Read operations on consecutive K clock rises is not permitted. The device will ignore the second Read request.
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PRELIMINARY
Write Cycle Descriptions[2, 10]
BWS0 L L L L H H H H H H H H BWS1 L L H H L L H H H H H H BWS2 L L H H H H L L H H H H BWS3 L L H H H H H H L L H H K L-H L-H L-H L-H L-H L-H K Comments
CY7C1323BV25
During the Data portion of a Write sequence, all four bytes (D[35:0]) are written into the device.
L-H During the Data portion of a Write sequence, all four bytes (D[35:0]) are written into the device. During the Data portion of a Write sequence, only the lower byte (D[8:0]) is written into the device. D[35:9] will remain unaltered.
L-H During the Data portion of a Write sequence, only the lower byte (D[8:0]) is written into the device. D[35:9] will remain unaltered. During the Data portion of a Write sequence, only the byte (D[17:9]) is written into the device. D[8:0] and D[35:18] will remain unaltered.
L-H During the Data portion of a Write sequence, only the byte (D[17:9]) is written into the device. D[8:0] and D[35:18] will remain unaltered. During the Data portion of a Write sequence, only the byte (D[26:18]) is written into the device. D[17:0] and D[35:27] will remain unaltered.
L-H During the Data portion of a Write sequence, only the byte (D[26:18]) is written into the device. D[17:0] and D[35:27] will remain unaltered. During the Data portion of a Write sequence, only the byte (D[35:27]) is written into the device. D[26:0] will remain unaltered. L-H During the Data portion of a Write sequence, only the byte (D[35:27]) is written into the device. D[26:0] will remain unaltered. No data is written into the device during this portion of a Write operation. L-H No data is written into the device during this portion of a Write operation.
Note: 10. Assumes a Write cycle was initiated per the Write Port Cycle Description Truth Table. BWS0, BWS1, BWS2, BWS3 can be altered on different portions of a Write cycle, as long as the set-up and hold requirements are achieved.
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PRELIMINARY
Maximum Ratings
(Above which the useful life may be impaired.) Storage Temperature ..................................... -65C to +150C Ambient Temperature with Power Applied.................................................. -55C to +125C Supply Voltage on VDD Relative to GND.........-0.5V to +3.6V DC Applied to Outputs in High-Z...........-0.5V to VDDQ + 0.5V DC Input Voltage[11] ................................-0.5V to VDDQ + 0.5V
CY7C1323BV25
Current into Outputs (LOW)......................................... 20 mA Static Discharge Voltage.......................................... > 2001V (per MIL-STD-883, Method 3015) Latch-up Current.................................................... > 200 mA
Operating Range
Range Com'l Ambient Temperature (TA) 0C to +70C VDD[12] 2.5 0.1V VDDQ[12] 1.4V to 1.9V
Electrical Characteristics Over the Operating Range[13] DC Electrical Characteristics
Parameter VDD VDDQ VOH VOL VOH(LOW) VOL(LOW) VIH VIL IX IOZ VREF IDD Description Power Supply Voltage I/O Supply Voltage Output HIGH Voltage Output LOW Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Voltage[11] Input LOW Voltage[11, 16] Input Load Current Output Leakage Current Input Reference Voltage[17] VDD Operating Supply GND VI VDDQ GND VI VDDQ, Output Disabled Typical Value = 0.75V VDD = Max., IOUT = 0 mA, 100 MHz f = fMAX = 1/tCYC 133 MHz 167 MHz ISB1 Automatic Power-Down Max. VDD, Both Ports 100 MHz Deselected, VIN VIH or 133 MHz VIN VIL f = fMAX = 1/tCYC, 167 MHz Inputs Static Test Conditions Min. VREF + 0.2 - Typ. - - Note 14 Note 15 IOH = -0.1 mA, Nominal Impedance IOL = 0.1 mA, Nominal Impedance Test Conditions Min. 2.4 1.4 VDDQ/2 - 0.12 VDDQ/2 - 0.12 VDDQ - 0.2 VSS VREF + 0.1 -0.3 -5 -5 0.68 0.75 Typ. 2.5 1.5 Max. 2.6 1.9 VDDQ/2 + 0.12 VDDQ/2 + 0.12 VDDQ 0.2 VDDQ + 0.3 VREF - 0.1 5 5 0.95 TBD TBD TBD TBD TBD TBD Unit V V V V V V V V A A V mA mA mA mA mA mA
AC Input Requirements
Parameter VIH VIL Description Input High (Logic 1) Voltage Input Low (Logic 0) Voltage Max. - VREF - 0.2 Unit V V
Thermal Resistance[18]
Parameter JA JC Description Test Conditions 165 FBGA Package 16.7 2.5 Unit C/W C/W Thermal Resistance (Junction to Ambient) Test conditions follow standard test methods and procedures for measuring Thermal Resistance (Junction to Case) thermal impedance, per EIA/JESD51.
Notes: 11. Overshoot: VIH(AC) < VDDQ + 0.85V (Pulse width less than tCYC/2). Undershoot: VIL(AC) > -1.5V (Pulse width less than tCYC/2). 12. Power-up: Assumes a linear ramp from 0V to VDD(min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD. 13. All Voltage referenced to Ground. 14. Output are impedance controlled. IOH = -(VDDQ/2)/(RQ/5) for values of 175 <= RQ <= 350. 15. Output are impedance controlled. IOL=(VDDQ/2)/(RQ/5) for values of 175 <= RQ <= 350s. 16. This spec is for all inputs except C and C Clock. For C and C Clock, VIL(Max.) = VREF - 0.2V. 17. VREF (Min.) = 0.68V or 0.46VDDQ, whichever is larger, VREF (Max.) = 0.95V or 0.54VDDQ, whichever is smaller. 18. Tested initially and after any design or process change that may affect these parameters.
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PRELIMINARY
Capacitance[18]
Parameter CIN CCLK CO Description Input Capacitance Clock Input Capacitance Output Capacitance Test Conditions TA = 25C, f = 1 MHz, VDD = 2.5V VDDQ = 1.5V
CY7C1323BV25
Max. 5 6 7
Unit pF pF pF
AC Test Loads and Waveforms
VDDQ/2 VREF OUTPUT Device Under Test Z0 = 50 RL = 50 VREF = 0.75V VDDQ/2 VREF OUTPUT Device Under ZQ Test INCLUDING JIG AND SCOPE 5 pF 0.25V VDDQ/2 R = 50 ALL INPUT PULSES 1.25V 0.75V
[17]
ZQ RQ=
250
RQ = 250 (b)
(a)
Switching Characteristics Over the Operating Range [19]
Cypress Consortium Parameter Parameter tPower[20] Cycle Time tCYC tKH tKL tKHKH tKHCH tKHKH tKHKL tKLKH tKHKH tKHCH K Clock and C Clock Cycle Time Input Clock (K/K and C/C) HIGH Input Clock (K/K and C/C) LOW K/K Clock Rise to K/K Clock Rise and C/C to C/C Rise (rising edge to rising edge) K/K Clock Rise to C/C clock Rise (rising edge to rising edge) Address Set-up to Clock (K and K) Rise Control Set-up to Clock (K and K) Rise (RPS, WPS, BWS0, BWS1) D[35:0] Set-up to Clock (K and K) Rise Address Hold after Clock (K and K) Rise Control Signals Hold after Clock (K and K) Rise (RPS, WPS, BWS0, BWS1) D[35:0] Hold after Clock (K and K) Rise 6.0 2.4 2.4 2.8 0.0 3.2 2.0 7.5 3.2 3.2 3.4 0.0 4.1 2.5 10.0 3.5 3.5 4.4 0.0 5.4 3.0 ns ns ns ns ns 167 MHz Description VCC (typical) to the First Access Read or Write 10 133 MHz 10 100 MHz 10 s Min. Max. Min. Max. Min. Max. Unit
Set-up Times tSA tSC tSD Hold Times tHA tHC tHD tHA tHC tHD 0.7 0.7 0.7 0.8 0.8 0.8 1.0 1.0 1.0 ns ns ns tSA tSC tSD 0.7 0.7 0.7 0.8 0.8 0.8 1.0 1.0 1.0 ns ns ns
Notes: 19. Unless otherwise noted, test conditions assume signal transition time of 2 V/ns, timing reference levels of 0.75V,VREF = 0.75V, RQ = 250, VDDQ = 1.5V, input pulse levels of 0.25V to 1.25V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of AC Test Loads. 20. This part has a voltage regulator that steps down the voltage internally; tPower is the time power needs to be supplied above VDD minimum initially before a Read or Write operation can be initiated. 21. tCHZ, tCLZ, are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured 100 mV from steady-state voltage. 22. At any given voltage and temperature tCHZ is less than tCLZ and, tCHZ less than tCO.
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PRELIMINARY
Switching Characteristics Over the Operating Range (continued)[19]
Cypress Consortium Parameter Parameter Output Times tCO tDOH tCHZ tCLZ tCCQO tCQD tCQDOH tCQHZ tCQLZ tCHQV tCHQX tCHZ tCLZ tCHCQV tCQHQV tCQHQX tCHZ tCLZ C/C Clock Rise (or K/K in single clock mode) to Data Valid Data Output Hold after Output C/C Clock Rise (Active to Active) Clock (C and C) Rise to High-Z (Active to High-Z)[21, 22] Clock (C and C) rise to Low-Z
[21, 22]
CY7C1323BV25
167 MHz Description
133 MHz
100 MHz
Min. Max. Min. Max. Min. Max. Unit 3.0 0.8 3.0 0.8 0.8 -0.40 0.40 -0.40 -0.45 3.2 0.40 -0.45 0.45 -0.50 0.8 0.8 3.6 0.45 -0.50 0.50 0.8 3.4 0.8 0.8 4.0 0.50 3.4 0.8 3.8 3.8 ns ns ns ns ns ns ns ns ns
C/C Clock Rise to Echo Clock Valid Echo Clock High to Data Valid Echo Clock High to Data Invalid Clock (CQ and CQ) Rise to High-Z (Active to High-Z)[21, 22] Clock (CQ and CQ) Rise to Low-Z[21, 22]
Switching Waveforms[23, 24, 25]
Notes: 23. Q01 refers to output from address A0. Q02 refers to output from the next internal burst address following A0, i.e., A0+1. 24. Output are disabled (High-Z) one clock cycle after a NOP. 25. In this example, if address A4 = A3, then data Q41 = D31, Q42 = D32, Q43 = D33, and Q44 = D34. Write data is forwarded immediately as read results.This note applies to the whole diagram.
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PRELIMINARY
IEEE 1149.1 Serial Boundary Scan (JTAG)
These SRAMs incorporate a serial boundary scan test access port (TAP) in the FBGA package. This part is fully compliant with IEEE Standard #1149.1-1900. The TAP operates using JEDEC standard 2.5V I/O logic levels. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port--Test Clock The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this pin unconnected if the TAP is not used. The pin is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI pin is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) on any register. Test Data-Out (TDO) The TDO output pin is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see Instruction codes). The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. Performing a TAP Reset A Reset is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a high-Z state. TAP Registers Registers are connected between the TDI and TDO pins and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction registers. Data is serially loaded into the TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the Document #: 38-05631 Rev. **
CY7C1323BV25
TDI and TDO pins as shown in TAP Controller Block Diagram. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture IR state, the two least significant bits are loaded with a binary "01" pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between TDI and TDO pins. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all of the input and output pins on the SRAM. Several no connect (NC) pins are also included in the scan register to reserve pins for higher density devices. The boundary scan register is loaded with the contents of the RAM Input and Output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the Input and Output ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions table. TAP Instruction Set Eight different instructions are possible with the three-bit instruction register. All combinations are listed in the Instruction Code table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO pins. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO pins and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction Page 10 of 18
PRELIMINARY
is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. The SAMPLE Z command puts the output bus into a High-Z state until the next command is given during the "Update IR" state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 10 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation.
CY7C1323BV25
The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required--that is, while data captured is shifted out, the preloaded data can be shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the shift-DR controller state. EXTEST Output Bus Three-state IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a three-state mode. The boundary scan register has a special bit located at bit #47. When this scan cell, called the "extest output bus three-state", is latched into the preload register during the "Update-DR" state in the TAP controller, it will directly control the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it will enable the output buffers to drive the output bus. When LOW, this bit will place the output bus into a High-Z condition. This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the "Shift-DR" state. During "Update-DR", the value loaded into that shift-register cell will latch into the preload register. When the EXTEST instruction is entered, this bit will directly control the output Q-bus pins. Note that this bit is pre-set HIGH to enable the output when the device is powered-up, and also when the TAP controller is in the "Test-Logic-Reset" state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions.
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PRELIMINARY
TAP Controller State Diagram[26] 1 TEST-LOGIC RESET
0
CY7C1323BV25
0
TEST-LOGIC/ IDLE
1
SELECT DR-SCAN 0 1 CAPTURE-DR 0 SHIFT-DR 1 EXIT1-DR 0 PAUSE-DR 1 0 EXIT2-DR 1 UPDATE-DR 1 0
1
1 SELECT IR-SCAN 0 1 CAPTURE-DR 0
0
SHIFT-IR 1
0
1
EXIT1-IR 0
1
0
PAUSE-IR 1 0 EXIT2-IR 1 UPDATE-IR 1 0
0
Note: 26. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
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PRELIMINARY
TAP Controller Block Diagram
CY7C1323BV25
0 Bypass Register TDI Selection Circuitry 31 30 29 . . 2 Instruction Register 2 1 0 1 0 Selection Circuitry TDO
Identification Register 106 . . . . 2 1 0
Boundary Scan Register
TCK TMS
TAP Controller
TAP Electrical Characteristics Over the Operating Range [11, 13, 27]
Parameter VOH1 VOH2 VOL1 VOL2 VIH VIL IX Description Output HIGH Voltage Output HIGH Voltage Output LOW Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Input and Output Load Current GND VI VDDQ Test Conditions IOH = -2.0 mA IOH = -100 A IOL = 2.0 mA IOL = 100 A 1.7 -0.3 -5 Min. 1.7 2.1 0.7 0.2 VDD + 0.3 0.7 5 Max. Unit V V V V V V A
TAP AC Switching Characteristics Over the Operating Range [28, 29]
Parameter tTCYC tTF tTH tTL Set-up Times tTMSS tTDIS tCS Hold Times tTMSH tTDIH tCH TMS Hold after TCK Clock Rise TDI Hold after Clock Rise Capture Hold after Clock Rise 10 10 10 ns ns ns TMS Set-up to TCK Clock Rise TDI Set-up to TCK Clock Rise Capture Set-up to TCK Rise 10 10 10 ns ns ns TCK Clock Cycle Time TCK Clock Frequency TCK Clock HIGH TCK Clock LOW 40 40 Description Min. 100 10 Max. Unit ns MHz ns ns
Notes: 27. These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics table. 28. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 29. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
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PRELIMINARY
TAP AC Switching Characteristics Over the Operating Range (continued)[28, 29]
Parameter Output Times tTDOV tTDOX TCK Clock LOW to TDO Valid TCK Clock LOW to TDO Invalid 0 Description
CY7C1323BV25
Min.
Max. 20
Unit ns ns
TAP Timing and Test Conditions[29]
1.25V 50 TDO Z0 = 50 CL = 20 pF 0V ALL INPUT PULSES 2.5V 1.25V
(a)
GND
tTH
tTL
Test Clock TCK
tTMSS tTMSH
tTCYC
Test Mode Select TMS
tTDIS tTDIH
Test Data-In TDI
Test Data-Out TDO
tTDOX
tTDOV
Identification Register Definitions
Value Instruction Field Revision Number (31:29) Cypress Device ID (28:12) Cypress JEDEC ID (11:1) ID Register Presence (0) CY7C1323BV25 000 01011111011100110 00000110100 1 Version number. Defines the type of SRAM. Allows unique identification of SRAM vendor. Indicate the presence of an ID register. Description
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PRELIMINARY
Scan Register Sizes
Register Name Instruction Bypass ID Boundary Scan Bit Size 3 1 32 107
CY7C1323BV25
Instruction Codes
Instruction EXTEST IDCODE SAMPLE Z RESERVED SAMPLE/PRELOAD RESERVED RESERVED BYPASS Code 000 001 010 011 100 101 110 111 Description Captures the Input/Output ring contents. Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. Captures the Input/Output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. Do Not Use: This instruction is reserved for future use. Captures the Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. Do Not Use: This instruction is reserved for future use. Do Not Use: This instruction is reserved for future use. Places the bypass register between TDI and TDO. This operation does not affect SRAM operation.
Boundary Scan Order
Bit # 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 Bump ID 6R 6P 6N 7P 7N 7R 8R 8P 9R 11P 10P 10N 9P 10M 11N 9M 9N 11L 11M 9L 10L 11K 10K
Boundary Scan Order (continued)
Bit # 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 Bump ID 9J 9K 10J 11J 11H 10G 9G 11F 11G 9F 10F 11E 10E 10D 9E 10C 11D 9C 9D 11B 11C 9B 10B 11A Page 15 of 18
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PRELIMINARY
Boundary Scan Order (continued)
Bit # 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 Bump ID Internal 9A 8B 7C 6C 8A 7A 7B 6B 6A 5B 5A 4A 5C 4B 3A 1H 1A 2B 3B 1C 1B 3D 3C 1D 2C 3E 2D 2E 1E 2F 3F 1G 1F 3G 2G 1J 2J 3K 3J 2K 1K 2L 3L Bit # 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106
CY7C1323BV25
Boundary Scan Order (continued)
Bump ID 1M 1L 3N 3M 1N 2M 3P 2N 2P 1P 3R 4R 4P 5P 5N 5R
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PRELIMINARY
Ordering Information
Speed (MHz) 167 133 100 Ordering Code CY7C1323BV25-167BZC CY7C1323BV25-133BZC CY7C1323BV25-100BZC Package Name BB165D Package Type 13 x 15 x 1.4 mm FBGA
CY7C1323BV25
Operating Range Commercial
Package Diagram
165 FBGA 13 x 15 x 1.40 mm BB165D
51-85180-**
All products and company names mentioned in this document may be the trademarks of their respective holders.
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(c) Cypress Semiconductor Corporation, 2004. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
PRELIMINARY
Document History Page
Document Title: CY7C1323BV25 18-Mb 4-Word Burst SRAM with DDR-I Architecture Document Number: 38-05631 Rev. ** ECN No. 253050 Issue Date See ECN Orig. of Change SYT New Data Sheet
CY7C1323BV25
Description of Change
Document #: 38-05631 Rev. **
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